Ihr Ansprechpartner
Adrian Bangerter
+41 62 285 80 13
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high current test of IGBTs, diodes or MOSFETs

MicroContact builds customized high current testers for testing high power semiconductors such as diodes, IGBTs or MOSFETs. The testers enable static and dynamic high current testing directly on the BARE DIE, on DCB level or on entire modules.

In the high-current test adapter, the special conditions are taken into account. This means that only the DUTs are measured and an influence of the adapter with the connecting leads on the result is avoided.

picture:  test station for dynamic high current test

For measurement technology, we rely on our long-standing and competent partner VX Instruments. Their reliable test systems, based among others on PXI, enable potential-free and precise measurements. The high current pulse SMUs guarantee very short test times.

picture: high current test system and inspection adapter              

 

your contact:
Adrian Bangerter
+41 62 285 80 13
This email address is being protected from spambots. You need JavaScript enabled to view it.